Open Access Info

Open Access Info

IEEE OPEN JOURNAL OF NANOTECHNOLOGY (OJ-NANO)

Scope
The IEEE Open Journal of Nanotechnology covers the theory, design, and development of nanotechnology and its scientific, engineering, and industrial applications.

Open Access
This journal is 100% open access, which means that all content is freely available without charge to users or their institutions. All articles are currently published under Creative Commons licenses (either CCBY or CCBY-NC-ND), and the author retains copyright. Users are allowed to read, download, copy, distribute, print, search, or link to the full texts of the articles published under CCBY, or use them for any other lawful purpose, as long as proper attribution is given.    Articles published under CCBY-NC-ND are also available to users under the same conditions as CCBY, but the reuse cannot be for commercial purposes or change the work in any way.

Open access is provided through the payment of an article processing charge (APC) paid after acceptance. APCs are often financed by an author’s institution or the funder supporting their research.

Article Processing Charge (APC): US$2045 (per article)
IEEE Members receive a 5% discount. IEEE Society Members receive a 15% discount. These discounts cannot be combined.

Corresponding authors from low income countries are eligible for waived or reduced APCs.

The articles in this journal are peer reviewed in accordance with the requirements set forth in the IEEE PSPB Operations Manual (sections 8.2.1.C & 8.2.2.A). Each published article was reviewed by a minimum of two independent reviewers using a single-blind peer review process, where the identities of the reviewers are not known to the authors, but the reviewers know the identities of the authors. Articles will be screened for plagiarism before acceptance.

ORCID
All IEEE journals require an Open Researcher and Contributor ID (ORCID) for all authors. ORCID is a persistent unique identifier for researchers and functions similarly to an article’s Digital Object Identifier (DOI). You will need a registered ORCID to submit an article or review a proof in this journal. Learn more about ORCID and sign up for an ORCID today.

Post-Acceptance
If your article is accepted for publication, you will receive emailed instructions regarding your next steps. You may be asked to upload final production ready files. Shortly after final files are uploaded, you will receive your article proofs for final review, along with instructions on how to review your proofs and submit any corrections. Please note that major changes to your article, including the list of references, are not permitted after the article is accepted for publication. Please contact the Editor-in-Chief if you have any doubts about whether a modification you wish to make is appropriate.

Benefits
Researchers rely on IEEE for trusted information. Over twelve million downloads from over five million unique users each month is strong evidence that the IEEE Xplore® digital library provides authors with the “findability” they seek.

IEEE maintains active partnerships with abstracting and indexing providers such as Elsevier, Clarivate Analytics, ProQuest, IET, and NLM to maximize the discovery of author works.

Authors publish with IEEE for heightened visibility, research activity, and industry credibility. IEEE continues to be the most cited publisher in U.S. and European new technology patents.

Authors will find that publishing with IEEE ensures professional development and exposure of their works.

Additionally, publishing within the IEEE Open Access program allows for:

  • Multimedia integration (video abstracts, etc.);
  • Each published article is accompanied by usage and citation data;
  • The advantage of being published by IEEE, whose journals are trusted, respected, and rank among the most highly cited;
  • Vast global reach to millions who search IEEE Xplore, attend conferences, and conduct research in all technology sectors;
  • All published articles will be maintained in the IEEE archive with free access to all.