Announcements

 

Announcements

APC Waiver extended to November 2022

 

The IEEE Open Journal of Nanotechnology (OJ-NANO) is dedicated to publishing articles on timely topics in the field of nanotechnology by making them available immediately, freely, and permanently available to all. All articles published in OJ-NANO are exposed to 5 million unique monthly users of the IEEE Xplore® Digital Library. Also, OJ-NANO is indexed in the Emerging Sources Citation Index (ESCI)™ by Clarivate Analytics, as well as is accepted for inclusion in Scopus®, meaning that articles will be discoverable in Web of Science™ and Elsevier’s abstract & citation database. It is expected to receive its first Impact Factor in 2023!

IEEE OJ-NANO Now Indexed in Web of Science’s ESCI™

We are delighted to announce that IEEE Open Journal of Nanotechnology (OJ-NANO) is now indexed in the Emerging Sources Citation Index (ESCI)™ by Clarivate Analytics, meaning that articles are now discoverable in Web of Science.

Launched in January 2020, gold open access IEEEOJ-NANO publishes novel and important engineering and scientific results at the nanoscale. Research results related to nanoscale devices, systems, materials, and their applications and underlying science are considered for peer-review and publication in this open access journal that is fully compliant with funder mandates, such as Plan S.

IEEE OJ-NANO Accepted for Inclusion in Scopus®

 

We are delighted to announce that IEEE Open Journal of Nanotechnology (OJ-NANO) is now accepted for inclusion in Scopus® by Elsevier, meaning that articles will be discoverable in Elsevier’s abstract and citation database!

Launched in January 2020, gold open access IEEE OJ-NANO publishes novel and important engineering and scientific results at the nanoscale. Research results related to nanoscale devices, systems, materials, and their applications and underlying science are considered for peer-review and publication in this open access journal that is fully compliant with funder mandates, such as Plan S.